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Registration Date 11 Apr 2016

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating


Electronics Sensor Product Number : PPP-NCSTAu-10



Atomic force microscope (AFM) tips AFM imaging


The probe offers unique features: metallic conductivity of the tip tip height 10 - 15 µm Au coating on both sides of the cantilever chemically inert high mechanical Q-factor for high sensitivity A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

Inert Versatility High Resonance Frequency High sensitivity Fast Scanning Ability Dissipate Static Charge

Manufacturer's Description

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.