FEEDBACK
PLEASE WAIT ...
CLOSE
CLOSE

Manufacturer

Country

Document

No Title 0.04 MB
No Title 0.23 MB
Registration Date 11 Apr 2016
Share

PointProbe® Plus Force Modulation Mode

(0)

Electronics Sensor Product Number : PPP-FM-W

Sensor

Applications

Atomic force microscope (AFM) tips AFM imaging

Properties

The probe offers unique features: guaranteed tip radius of curvature < 10 nm tip height 10 - 15 µm highly doped to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series

Versatility High sensitivity Dissipate Static Charge

Manufacturer's Description

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM tip serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.