No Title 0.04 MB
Registration Date 11 May 2016

Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating


Electronics Sensor Product Number : PPP-QLC-MFMR-10



Atomic force microscope (AFM) tips AFM imaging


The SPM probe offers unique features: soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization of app. 225 emu/cm3) effective magnetic moment 0.75x of standard probes guaranteed tip radius of curvature < 30 nm magnetic resolution better than 35 nm tip height 10 - 15 µm Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5 excellent mechanical Q-factor under UHV conditions for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series

Low Coercivity

Manufacturer's Description

The NANOSENSORS™ PPP-QLC-MFMR AFM probe combines the low disturbance of magnetic samples by a soft magnetic coating with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. Low coercivity and a Q-factor of more than 35,000 enable magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

The soft magnetic coating on the tip has a coercivity of app. 0.75 Oe and a remanence magnetization of app. 225 emu/cm3(these values were determined on a flat surface).