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List of Products

PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution,Excellent Mechanical Q-factor under UHV Conditions

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™Non-Contact/Tapping Mode, Au coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™Non-Contact/Tapping Mode, Au coated

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

Properties :

Inert,High sensitivity

Application :

Atomic force microscope (AFM) tips
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

Properties :

Inert,High sensitivity

Application :

Atomic force microscope (AFM) tips
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

Properties :

Inert,High sensitivity

Application :

Atomic force microscope (AFM) tips
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

ELECTRONICS - SENSOR   |  AFM TIP

Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

Properties :

Mechanical Resistance,Inert,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency

Application :

Biology,AFM imaging
uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

ELECTRONICS - SENSOR   |  AFM TIP

Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

Properties :

Mechanical Resistance,Inert,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency

Application :

Biology,AFM imaging
uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

ELECTRONICS - SENSOR   |  BIOSENSOR

Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

Properties :

Mechanical Resistance,Inert,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency

Application :

Biology,AFM imaging
uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

ELECTRONICS - SENSOR   |  BIOSENSOR

Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

Properties :

Mechanical Resistance,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency

Application :

Biology,AFM imaging
uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

ELECTRONICS - SENSOR   |  BIOSENSOR

Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

Properties :

Mechanical Resistance,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency

Application :

Biology,AFM imaging
uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

ELECTRONICS - SENSOR   |  BIOSENSOR

Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology with Triangular cantilevers

Properties :

Mechanical Resistance,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency

Application :

Biology,AFM imaging