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List of Products 855 Result

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution,Excellent Mechanical Q-factor under UHV Conditions

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™Non-Contact/Tapping Mode, Au coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™Non-Contact/Tapping Mode, Au coated

Switzerland Switzerland NanoWorld

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

Switzerland Switzerland NanoWorld

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

Switzerland Switzerland NanoWorld

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated

Switzerland Switzerland NanoWorld

Properties :

Electrical Conductivity,High sensitivity,Real Tip Visibility from Top

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity

Application :

Atomic force microscope (AFM) tips
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

ELECTRONICS - SENSOR   |  AFM TIP

Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity

Application :

Atomic force microscope (AFM) tips