
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties :
Versatility,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Low MomentumApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Low MomentumApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Low MomentumApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivity,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivity,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivity,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Advanced Tip at the End of the Cantilever™ Force Modulation Mode
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Advanced Tip at the End of the Cantilever™ Force Modulation Mode
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Advanced Tip at the End of the Cantilever™ Force Modulation Mode
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Platinum Silicide Probes Force Modulation Mode
Properties :
Wear Resistance,High sensitivity,Fast Scanning AbilityApplication :
Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
ELECTRONICS - SENSOR | SENSOR
Platinum Silicide Probes Force Modulation Mode
Properties :
Wear Resistance,High sensitivity,Fast Scanning AbilityApplication :
Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
ELECTRONICS - SENSOR | SENSOR
Platinum Silicide Probes Force Modulation Mode
Properties :
Wear Resistance,High sensitivity,Fast Scanning AbilityApplication :
Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging