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Product Type66

Industries14

Nanomaterials17

Morphology5

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Properties127

Applications108

Manufacturers48

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List of Products 472 Result

PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Low Momentum

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Low Momentum

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Low Momentum

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Platinum Silicide Probes Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Platinum Silicide Probes Force Modulation Mode

Properties :

Wear Resistance,High sensitivity,Fast Scanning Ability

Application :

Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
Platinum Silicide Probes Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Platinum Silicide Probes Force Modulation Mode

Properties :

Wear Resistance,High sensitivity,Fast Scanning Ability

Application :

Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
Platinum Silicide Probes Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Platinum Silicide Probes Force Modulation Mode

Properties :

Wear Resistance,High sensitivity,Fast Scanning Ability

Application :

Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging