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List of Products 469 Result

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  CANTILEVER

Tipless - Non-Contact/Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  CANTILEVER

Tipless - Non-Contact/Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  CANTILEVER

Tipless - Non-Contact/Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating

Switzerland Switzerland NanoWorld

Properties :

Electrical Conductivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

ELECTRONICS - SENSOR   |  AFM TIP

Cr Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

ELECTRONICS - SENSOR   |  AFM TIP

Cr Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

ELECTRONICS - SENSOR   |  AFM TIP

Cr Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

ELECTRONICS - SENSOR   |  AFM TIP

Cr Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)

ELECTRONICS - SENSOR   |  AFM TIP

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging