ELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution,Excellent Mechanical Q-factor under UHV ConditionsApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Properties :
Inert,Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Properties :
Inert,Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Properties :
Inert,Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Properties :
Inert,Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Inert,Versatility,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever™Non-Contact/Tapping Mode, Au coated
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from TopApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from TopApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from TopApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from TopApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode
Properties :
Inert,High sensitivityApplication :
Atomic force microscope (AFM) tipsELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode
Properties :
Inert,High sensitivityApplication :
Atomic force microscope (AFM) tipsELECTRONICS - SENSOR | AFM TIP
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode
Properties :
Inert,High sensitivityApplication :
Atomic force microscope (AFM) tips
ELECTRONICS - SENSOR | AFM TIP
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
ELECTRONICS - SENSOR | AFM TIP
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
ELECTRONICS - SENSOR | AFM TIP
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy