ELECTRONICS - SENSOR | SENSOR
PLateau Tip - Force Modulation Mode - Reflex Coating
Properties : High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PLateau Tip - Force Modulation Mode
Properties : High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Tipless - Force Modulation Mode
Properties : Inert,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Tipless - Force Modulation Mode
Properties : Inert,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Tipless - Force Modulation Mode
Properties : Inert,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Au PointProbe® Plus Force Modulation Mode - Au coating
Properties : Versatility
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties : Versatility,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties : Versatility,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties : Versatility,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties : Versatility,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating
Properties : Low Coercivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties : Low Coercivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties : Low Coercivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties : Low Coercivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Low Momentum
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Low Momentum
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Low Momentum
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties : Wear Resistance,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties : Wear Resistance,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties : Wear Resistance,High sensitivity
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties : Wear Resistance,High sensitivity,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties : Wear Resistance,High sensitivity,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties : Wear Resistance,High sensitivity,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating
Properties : High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties : Versatility,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties : Versatility,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties : Versatility,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties : Versatility,High sensitivity,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated
Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Advanced Tip at the End of the Cantilever™ Force Modulation Mode
Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge
Application : Atomic force microscope (AFM) tips,AFM imaging
