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Nanomaterials4

Morphology2

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Properties24

Applications6

Manufacturers3

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List of Products

MK240 NANO

ELECTRONICS - ELECTRICAL ACCESSORIES   |  MOUSE

MK240 NANO

Properties :

Fast data transmission,Responsive cursor control
PLateau Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

PLateau Tip - Force Modulation Mode - Reflex Coating

Properties :

High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PLateau Tip - Force Modulation Mode

Properties :

High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Au coating

ELECTRONICS - SENSOR   |  SENSOR

Au PointProbe® Plus Force Modulation Mode - Au coating

Properties :

Versatility

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Low Momentum

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Low Momentum

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Low Momentum

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties :

Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond coated Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties :

Wear Resistance,High sensitivity,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties :

Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties :

Versatility,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging