
ELECTRONICS - ELECTRICAL ACCESSORIES | MOUSE
MK240 NANO
Properties :
Fast data transmission,Responsive cursor control
ELECTRONICS - SENSOR | SENSOR
PLateau Tip - Force Modulation Mode - Reflex Coating
Properties :
High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PLateau Tip - Force Modulation Mode
Properties :
High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Tipless - Force Modulation Mode
Properties :
Inert,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Tipless - Force Modulation Mode
Properties :
Inert,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Tipless - Force Modulation Mode
Properties :
Inert,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Au PointProbe® Plus Force Modulation Mode - Au coating
Properties :
VersatilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties :
Versatility,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties :
Versatility,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties :
Versatility,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating
Properties :
Versatility,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating
Properties :
Low CoercivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Low MomentumApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Low MomentumApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Low MomentumApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Point Probe® Plus Magnetic Force Microscopy - Reflex Coating
Properties :
Electrical Conductivity,High sensitivity,Enhanced Resolution,CoercitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivity,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivity,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
C Diamond coated Tip - Force Modulation Mode - Reflex Coating
Properties :
Wear Resistance,High sensitivity,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al PointProbe® Plus Force Modulation Mode - Reflex Coating
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
PointProbe® Plus Force Modulation Mode
Properties :
Versatility,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated
Properties :
High sensitivity,Real Tip Visibility from Top,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging