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350 Result

ELECTRONICS - SENSOR   |  SENSOR

PLateau Tip - Force Modulation Mode - Reflex Coating

Properties : High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

PLateau Tip - Force Modulation Mode

Properties : High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties : Inert,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties : Inert,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties : Inert,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Au PointProbe® Plus Force Modulation Mode - Au coating

Properties : Versatility

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties : Versatility,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties : Versatility,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties : Versatility,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties : Versatility,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

Properties : Low Coercivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties : Low Coercivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties : Low Coercivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties : Low Coercivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Low Momentum

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Low Momentum

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Low Momentum

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

Properties : Electrical Conductivity,High sensitivity,Enhanced Resolution,Coercitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties : Wear Resistance,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties : Wear Resistance,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

Properties : Wear Resistance,High sensitivity

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties : Wear Resistance,High sensitivity,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties : Wear Resistance,High sensitivity,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

C Diamond coated Tip - Force Modulation Mode - Reflex Coating

Properties : Wear Resistance,High sensitivity,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

Properties : High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Al PointProbe® Plus Force Modulation Mode - Reflex Coating

Properties : Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties : Versatility,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties : Versatility,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties : Versatility,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Force Modulation Mode

Properties : Versatility,High sensitivity,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties : High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application : Atomic force microscope (AFM) tips,AFM imaging