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List of Products 348 Result

Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

ELECTRONICS - SENSOR   |  SENSOR

Cr Advanced Tip at the End of the Cantilever™ Force Modulation Mode, Pt/Ir coated

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Advanced Tip at the End of the Cantilever™ Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

Properties :

High sensitivity,Real Tip Visibility from Top,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Platinum Silicide Probes Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Platinum Silicide Probes Force Modulation Mode

Properties :

Wear Resistance,High sensitivity,Fast Scanning Ability

Application :

Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
Platinum Silicide Probes Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Platinum Silicide Probes Force Modulation Mode

Properties :

Wear Resistance,High sensitivity,Fast Scanning Ability

Application :

Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
Platinum Silicide Probes Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Platinum Silicide Probes Force Modulation Mode

Properties :

Wear Resistance,High sensitivity,Fast Scanning Ability

Application :

Scanning Capacitance Microscopy,Electrostatic Force Microscopy (EFM),Kelvin Probe Force Microscopy (KFPM)
PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating (Detector Side)

ELECTRONICS - SENSOR   |  SENSOR

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating (Detector Side)

Properties :

Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Properties :

Wear Resistance,High Resonance Frequency,Hardness,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Properties :

Wear Resistance,High Resonance Frequency,Hardness,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

Properties :

Wear Resistance,High Resonance Frequency,Hardness,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Wear Resistance,High Resonance Frequency,Hardness,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Wear Resistance,High Resonance Frequency,Hardness,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Al Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

Wear Resistance,High Resonance Frequency,Hardness,High sensitivity,Fast Scanning Ability

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

Properties :

Inert,High Resonance Frequency,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

Properties :

Inert,High Resonance Frequency,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

Properties :

Inert,High Resonance Frequency,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging