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Product Type
8
Laser
148
Afm Tip
128
Sensor
65
Cantilever
3
Biosensor
1
Mouse
1
Light Emitting Diode (LED)
1
Chip
1
Industries
1
Electronics
348
Sensor
197
Laser
148
Electrical Accessories
1
Light Emitting Diode (LED)
1
Processor
1
Nanomaterials
4
Aluminum ( Nanostructure Co...
61
Chromium ( Nanostructure Co...
12
Aluminum ( Nanoparticle /Na...
3
Gold ( Nanostructure Coatin...
1
Morphology
2
Nanostructure Coating
77
Nanoparticle /Nanopowder
3
Countries
1
Switzerland
348
Properties
24
High sensitivity
177
CW operation mode
148
Dissipate Static Charge
132
Fast Scanning Ability
94
High Resonance Frequency
75
Versatility
60
Enhanced Resolution
45
Inert
44
Unrivalled Sharpness
24
Wear Resistance
18
Stiffness
16
Electrical Conductivity
12
Real Tip Visibility from Top
11
Hardness
6
Coercitivity
4
Low Coercivity
4
Low Momentum
3
Small Dispersion of Resonan...
1
Small Dispersion of Force C...
1
Compatibility with SPMs
1
Mechanical Resistance
1
Excellent Mechanical Q-fact...
1
Responsive cursor control
1
Fast data transmission
1
Applications
8
Atomic force microscope (AF...
187
AFM imaging
182
Scanning Capacitance Micros...
6
Kelvin Probe Force Microsco...
3
Electrostatic Force Microsc...
3
Biology
1
OLED
1
LED display
1
Manufacturers
5
NanoWorld
197
Alpes Lasers
148
Logitech
1
Avantama AG
1
IMT Microtechnologies
1
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List of Products
348 Result
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| CANTILEVER
Tipless - Non-Contact/Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| CANTILEVER
Tipless - Non-Contact/Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| CANTILEVER
Tipless - Non-Contact/Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating
Switzerland
NanoWorld
Properties :
Electrical Conductivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Cr
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Cr
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Cr
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Cr
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - PtIr5 Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant
Switzerland
NanoWorld
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
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