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Product Type
8
Laser
148
Afm Tip
128
Sensor
65
Cantilever
3
Biosensor
1
Mouse
1
Light Emitting Diode (LED)
1
Chip
1
Industries
1
Electronics
348
Sensor
197
Laser
148
Electrical Accessories
1
Light Emitting Diode (LED)
1
Processor
1
Nanomaterials
4
Aluminum ( Nanostructure Co...
61
Chromium ( Nanostructure Co...
12
Aluminum ( Nanoparticle /Na...
3
Gold ( Nanostructure Coatin...
1
Morphology
2
Nanostructure Coating
77
Nanoparticle /Nanopowder
3
Countries
1
Switzerland
348
Properties
24
High sensitivity
177
CW operation mode
148
Dissipate Static Charge
132
Fast Scanning Ability
94
High Resonance Frequency
75
Versatility
60
Enhanced Resolution
45
Inert
44
Unrivalled Sharpness
24
Wear Resistance
18
Stiffness
16
Electrical Conductivity
12
Real Tip Visibility from Top
11
Hardness
6
Coercitivity
4
Low Coercivity
4
Low Momentum
3
Small Dispersion of Resonan...
1
Small Dispersion of Force C...
1
Compatibility with SPMs
1
Mechanical Resistance
1
Excellent Mechanical Q-fact...
1
Responsive cursor control
1
Fast data transmission
1
Applications
8
Atomic force microscope (AF...
187
AFM imaging
182
Scanning Capacitance Micros...
6
Kelvin Probe Force Microsco...
3
Electrostatic Force Microsc...
3
Biology
1
OLED
1
LED display
1
Manufacturers
5
NanoWorld
197
Alpes Lasers
148
Logitech
1
Avantama AG
1
IMT Microtechnologies
1
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List of Products
348 Result
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Unrivalled Sharpness
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
Point Probe® Plus Non-Contact / Tapping Mode - Long Cantilever - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution,Excellent Mechanical Q-factor under UHV Conditions
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
High Resonance Frequency,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
Inert,High Resonance Frequency,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Al
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Switzerland
NanoWorld
Properties :
Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Soft Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge,Enhanced Resolution
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Inert,Versatility,High sensitivity,Fast Scanning Ability,Dissipate Static Charge
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever™Non-Contact/Tapping Mode, Au coated
Switzerland
NanoWorld
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from Top
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated
Switzerland
NanoWorld
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from Top
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated
Switzerland
NanoWorld
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from Top
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever Non-Contact/Tapping Mode, Pt/Ir coated
Switzerland
NanoWorld
Properties :
Electrical Conductivity,High sensitivity,Real Tip Visibility from Top
Application :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,High sensitivity
Application :
Atomic force microscope (AFM) tips
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,High sensitivity
Application :
Atomic force microscope (AFM) tips
ELECTRONICS - SENSOR
| AFM TIP
Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode
Switzerland
NanoWorld
Properties :
Inert,High sensitivity
Application :
Atomic force microscope (AFM) tips
ELECTRONICS - SENSOR
| AFM TIP
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
ELECTRONICS - SENSOR
| AFM TIP
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
ELECTRONICS - SENSOR
| AFM TIP
Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency
Switzerland
NanoWorld
Properties :
Wear Resistance,High Resonance Frequency,High sensitivity,Fast Scanning Ability
Application :
Atomic force microscope (AFM) tips,Scanning Capacitance Microscopy
ELECTRONICS - SENSOR
| BIOSENSOR
Uniqprobe uniform quality SPM probe – Contact or dynamic mode for Biology in dynamic (AC) mode
Switzerland
NanoWorld
Properties :
Mechanical Resistance,Inert,Versatility,Compatibility with SPMs,Small Dispersion of Force Constant,Small Dispersion of Resonance Frequency
Application :
Biology,AFM imaging
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