| SOUTH KOREA |  |
Park Systems Corp. was founded as PSIA in 1997 by Dr. Sang-il Park, a co-founder of Park Scientific Instruments, one of the pioneers in developing commercialized AFM. PSIA changed its name to Park Systems to reflect the company’s focus on total metrological solutions and atomic force Microscopes and scanning probe microscopes for both small and large-sample measurement. Beside the nanoscale microscopy tools for research applications the company also offers an industrial product line that extends its innovative NX technology to a variety of metrological applications, including hard disk inspection, next-generation sliders, sidewall/overhang imaging and profiling, Semiconductor and Wafer-Fab manufacturing. In December 2015, Park Systems held its IPO, joining the KOSDAQ Composite Index. The company holds several unique distinctions such as being the first company listed on the KOSDAQ to receive multiple “AA” ratings on technical evaluations of their technologies.
