Electronics SensorAfm Tip
These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes are designed for nanoindenation and induce high levels of plastic deformation which allows hem to be used with Oliver-Pharr analysis to measure both the modulus and hardness of materials. These probes have demonstrated highly repeatable deep (~100nm) indentations in fused silica. The high resolution tip apex enables in-situ imaging of indents using the same probe.