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Registration Date	10 Mar 2016
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Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

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Electronics Sensor Product Number : PtSi-NCH-10

Afm Tip

Applications

NANOSENSORS PtSi-FM probes are suitable for C-AFM, Tunneling AFM and Scanning Capacitance Microscopy (SCM).

Atomic force microscope (AFM) tips Scanning Capacitance Microscopy

Properties

platinum silicide coating with excellent conductivity and good wear-out behavior high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip

Wear Resistance High Resonance Frequency High sensitivity Fast Scanning Ability

Manufacturer's Description

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-FM probes are suitable for C-AFM, Tunneling AFM and Scanning Capacitance Microscopy (SCM).The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.