PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

guaranteed tip radius of curvature < 10nm tip height 10 - 15 µm highly doped to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.