FEEDBACK
PLEASE WAIT ...
CLOSE
CLOSE

Manufacturer

Country

Document

No Title 0.04 MB
No Title 0.23 MB
Registration Date 11 Mar 2016
Share

PointProbe® Plus Non-Contact / Soft Tapping Mode

(0)

Electronics Sensor Product Number : PPP-NCST-50

Afm Tip

Applications

Atomic force microscope (AFM) tips AFM imaging

Properties

guaranteed tip radius of curvature < 10 nm tip height 10 - 15 µm highly doped to dissipate static charge chemically inert high mechanical Q-factor for high sensitivit

Inert Versatility High sensitivity Dissipate Static Charge Enhanced Resolution

Manufacturer's Description

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time