PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

guaranteed tip radius of curvature < 10 nm tip height 10 - 15 µm highly doped to dissipate static charge Al coating on detector side of cantilever chemically inert high mechanical Q-factor for high sensitivity

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.