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Registration Date 11 Mar 2016
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PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

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Electronics Sensor Product Number : PPP-SEIHR-W

Afm Tip

Nanomaterials

Manufacturer Asserted

Aluminum

Al Nanostructure Coating CAS Number : 7429-90-5
Density : 30 nm

Applications

Atomic force microscope (AFM) tips AFM imaging

Properties

guaranteed tip radius of curvature < 10 nm tip height 10 - 15 µm highly doped to dissipate static charge Al coating on detector side of cantilever high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series

Versatility High sensitivity Dissipate Static Charge Enhanced Resolution

Manufacturer's Description

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIHR AFM probes (Seiko Instruments / high force constant). Compared with the ZEIHR type the force constant is further reduced.The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.