PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating

guaranteed tip radius of curvature < 10nm tip height 10 - 15 µm highly doped to dissipate static charge Al coating on detector side of cantilever chemically inert high mechanical Q-factor for high sensitivity tip repositioning accuracy of better than ± 8 µm (in combination with Align ment Chip)

The XY-auto-alignment probes for Non-Contact / Soft Tapping mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 150 µm short cantilevers optimized for non-contact / soft tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8 µmis possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-XYNCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.