No Title 0.04 MB
Registration Date 12 Mar 2016

SuperSharpSilicon - Non-Contact / Tapping Mode - Long Cantilever


Electronics Sensor Product Number : SSS-NCL-50

Afm Tip


Atomic force microscope (AFM) tips AFM imaging


guaranteed tip radius of curvature < 5 nm typical tip radius of curvature of 2 nm typical aspect ratio at 200 nm from tip apex in the order of 4:1 half cone angle at 200 nm from apex < 10° monolithic material highly doped to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series

Inert High Resonance Frequency High sensitivity Fast Scanning Ability Dissipate Static Charge Unrivalled Sharpness

Manufacturer's Description

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.