No Title 0.04 MB
Registration Date 13 Mar 2016

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating


Electronics Sensor Product Number : PL2-NCLR-10

Afm Tip


Atomic force microscope (AFM) tips AFM imaging


plateau diameter of typically 1.8 µm single crystalline silicon highly doped to dissipate static charge Al coating on detector side of cantilever chemically inert high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series

High sensitivity Fast Scanning Ability Dissipate Static Charge

Manufacturer's Description

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.NANOSENSORS™ PL2-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PL2-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.