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Registration Date	13 Mar 2016
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SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

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Electronics Sensor Product Number : SSS-NCH-W

Afm Tip

Applications

Atomic force microscope (AFM) tips AFM imaging

Properties

guaranteed tip radius of curvature < 5 nm typical tip radius of curvature of 2 nm typical aspect ratio at 200 nm from tip apex in the order of 4:1 half cone angle at 200 nm from apex < 10° monolithic material highly doped to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity

Inert High sensitivity Dissipate Static Charge Unrivalled Sharpness

Manufacturer's Description

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.