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Registration Date	13 Mar 2016
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SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

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Electronics Sensor Product Number : SSS-NCHR-W

Afm Tip

Applications

Atomic force microscope (AFM) tips AFM imaging

Properties

guaranteed tip radius of curvature < 5 nm typical tip radius of curvature of 2 nm typical aspect ratio at 200 nm from tip apex in the order of 4:1 half cone angle at 200 nm from apex < 10o highly doped to dissipate static charge high mechanical Q-factor for high sensitivity

High sensitivity Dissipate Static Charge Unrivalled Sharpness

Manufacturer's Description

NANOSENSORS™ SSS-NCHR AFM tips are designed for non-contact mode or Tapping Mode AFM. For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.