Electronics Sensor Product Number : AR5-NCH-50Afm Tip
length of the high aspect ratio portion of the tip > 2 µm typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along cantilever axis) half cone angle at 2 µm of the high aspect ratio portion typically < 5° guaranteed tip radius of curvature < 15 nm monolithic tip highly doped silicon to dissipate static charge high mechanical Q-factor for high sensitivity
NANOSENSORS™ AR5-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.