Electronics Sensor Product Number : AR10-NCH-10Afm Tip
length of the high aspect ratio portion of the tip > 1.5 µm typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis) half cone angle at 1.5 µm of the high aspect ratio portion typically < 2.8° guaranteed tip radius of curvature < 15 nm monolithic tip highly doped silicon to dissipate static charge high mechanical Q-factor for high sensitivity
NANOSENSORS™ AR10-NCH AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.