FEEDBACK
PLEASE WAIT ...
CLOSE
CLOSE

Manufacturer

Country

Document

No Title 0.04 MB
No Title 0.23 MB
Registration Date 14 Mar 2016
Share

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

(0)

Electronics Sensor Product Number : AR10-NCH-10

Afm Tip

Applications

Atomic force microscope (AFM) tips AFM imaging

Properties

length of the high aspect ratio portion of the tip > 1.5 µm typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis) half cone angle at 1.5 µm of the high aspect ratio portion typically < 2.8° guaranteed tip radius of curvature < 15 nm monolithic tip highly doped silicon to dissipate static charge high mechanical Q-factor for high sensitivity

High sensitivity Fast Scanning Ability Dissipate Static Charge

Manufacturer's Description

NANOSENSORS™ AR10-NCH AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.