PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

plateau diameter of typically 1.8 µm single crystalline silicon highly doped to dissipate static charge Al coating on detector side of cantilever high mechanical Q-factor for high sensitivity

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.NANOSENSORS™ PL2-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.