Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

The probe offers unique features: real diamond coating tip height 10 - 15 µm high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series The DT Diamond coating is an approximately 100 nm thick coating of polycrystalline diamond on the tip-side of the cantilever leading to an unsurpassed hardness of the tip. The raman spectrum of the coating verifies the real diamond coating. The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

NANOSENSORS™ DT-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non-contact probee (NCH). The NCL type cantilever is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.