Advanced Tip at the End of the Cantilever™ Force Modulation Mode

The probe offers unique features: real tip visibility from top typical tip radius of curvature better than 10 nm tip height 15 - 20 µm monolithic silicon highly doped silicon to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity

NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.