PLateau Tip - Force Modulation Mode - Reflex Coating

plateau diameter of typically 1.8 µm single crystalline silicon highly doped silicon to dissipate static charge Al coating on detector side of cantilever chemically inert high mechanical Q-factor for high sensitivity alignment grooves on backside of silicon holder chip precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series

tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

The PL2-FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.