Electronics Sensor Product Number : ZW-S7020 0.3MSensor
Measure accurately Inclined or curved surfaces High-speed sampling for accurate shape measurements Measure more objects quickly Efficient installation and motion solutions increase manufacturing speed Increase throughput: Simultaneous measurements can be achieved using multiple sensor heads Increase speed: Reduce settling time Save Time and Money: No need to rotate the sensor Flexible fiber cable for easy installation Set up quickly Easy to design and tune Reduced work for installation and tuning of sensor heads No rigidity measures required Reduced work - EMC measures and thermal design are not required No laser safety measures required Quick integration into machine HMI
Strict quality control, demands for appearance inspection and production speed are constantly increasing. To meet these demands, stable measurements during movement for quality inspection without compromising manufacturing speed is required. Harnessing the benefits of the white light confocal principle, the ZW-7000 can provide stable measurements for different material types (glass, metal, plastic, etc.) and shapes (round, flat, uneven, etc).
With a traditional laser displacement sensors, it is required to re-tune after the sensor head direction is changed for a different material type.
Our white light confocal displacement sensor can measure a different material types while moving, without needing to re-tune the sensor nor changing the sensor head or installation direction.
Our white light confocal displacement sensors can provide accurate flatness measurement by tracing an object without being affected by its excessive reflection, the sensor head direction, nor the material hairline direction, which are difficult to track with a traditional laser displacement sensor.
Using traditional laser sensors, the measurement accuracy for a moving target can be achieved by increasing the averaging times, but downside is that this lowers the profile reproduction accuracy.The ZW-7000 acquires a sharp profile by a single sampling as fast as 20 μs without averaging, solving this issue.