High Stability, Low Noise Vibration Rejecting Yaw Rate Gyro

Industrial applications Severe Mechanical Environments Platform stabilization

Complete rate gyroscope on a single chip Z-axis (yaw rate) response 12°/hour bias stability 0.01°/√second angle random walk High vibration rejection over wide frequency Measurement range extendable to a maximum of ±450°/s 10,000 g powered shock survivability Ratiometric to referenced supply 6 V single-supply operation See data sheet for additional features ADXRS646-EP supports defense and aerospace applications (AQEC Standard) Download ADXRS646-EP Data Sheet Temperature range: −55°C to +105°C Controlled manufacturing baseline One assembly/test site One fabrication site Enhanced product change notification Qualification data available on request V62/14618 DSCC Drawing Number

The ADXRS64x family of low noise, vibration rejecting yaw rate gyroscopes are drop-in performance upgrades to existing designs using the ADXRS62x family.

The ADXRS646 is pin- and package-compatible to the ADXRS62x family and offers a measurement range of ±250°/s, 1 kHz bandwidth, 12°/hr drift with low broadband noise, low g sensitivity of 0.015°/s/g and vibration rectification of 0.0001°/s/g², is ideally suited for high performance navigation and platform stabilization.

The ADXRS646 is a complete angular rate sensor (gyroscope) that uses the Analog Devices, Inc. patented high volume BiMOS surface-micromachining process to make a complete gyro on one chip. An advanced, differential, quad sensor design rejects the influence of linear acceleration and vibration, enabling the ADXRS646 to offer rate sensing in harsh environments where shock and vibration are present.

The output signal, RATEOUT (1B, 2A), is a voltage proportional to angular rate about the axis normal to the top surface of the package. The measurement range is a minimum of ±250°/s. The output is ratiometric with respect to a provided reference supply. Other external capacitors are required for operation.

A temperature output is provided for compensation techniques. Two digital self-test inputs electromechanically excite the sensor to test proper operation of both the sensor and the signal conditioning circuits. The ADXRS646 is available in a 7 mm × 7 mm × 3 mm BGA chip-scale package.