|Registration Date||15 Jun 2017|
Others Other productsScanning probe microscope
High-performance versatile AFM Optical access from top, side and bottom optimized for Raman, TERS and SNOM Flexible optical design providing any combination of excitation/collection configurations Automated AFM laser, probe and photodiode alignment User-friendly change of wavelength of AFM registration system laser and photodiode Easy and user-friendly change of objectives Integration with IR s-SNOM (optional)
Versatile automated AFM-Raman, SNOM and TERS system
NTEGRA Spectra II with the help of Tip Enhanced Raman Scattering (TERS) allows carrying out spectroscopy/microscopy with nanometer scale resolution. Specially prepared AFM probes (nanoantennas) canbe used for TERS to enhance and localize light at the nanometer scale area near the tip apex.
Such nanoantennas act as a “nano-source” of light giving possibility of optical imaging with resolution less than a diffraction limit (up to ~ 10 nm). Scanning near-field optical microscopy (SNOM) is another approach to obtain optical and spectroscopy images of optically active samples with resolution limited by probe aperture size (~ 100 nm).