Others Other productsScanning probe microscope
Cantilever recognition and automatic laser alignment both in liquid and air Autofocus Panoramic optical field of view up to 7×7mm with 2um resolution Point-and-click motorized precise sample positioning Gentle engagement procedure and automatic feedback loop adjustment Automated MultiScan™ routine on 5x5mm range with stitching of overlapping scans 100s of scans per day automatically Automatic software configuration for all advanced modes 3D mouse for controlling sample stage and optical microscope step movers Advanced control electronics Powerful and flexible PX Ultra controller allows high-quality AFM operations with small deflection noise (~25 fm/√Hz), low-noise high voltage drive (noise < 1mV/600V) and multi-frequency measurements with five lock-in amplifiers. Easy-to-use and flexible software Nova PX software contains predefined settings and smart algorithms for fast configuration of the NEXT operation in all advanced modes. Along with fast configuration Nova PX software allows researchers to have unlimited experiment flexibility. Topography measurements Contact AFM and AM-AFM (semicontact and non-contact modes) are available for topography measurements with the option of viewing several relevant signals. Curves analysis Analysis of data curves of various nature (distance relations of force, amplitude, frequency, phase, or current, as well as bias voltage relations of force or current) supplies a vast amount of diverse information on the sample. Electrical studies NEXT offers a wide variety of electric measurement techniques, including Electrostatic force microscopy with amplitude and frequency modulation, Kelvin probe force microscopy with amplitude or phase modulation, measurement of dC/dZ and dC/dV relations, quantitative probing of dielectric properties and Spreading resistance imaging. STM measurements STM measurements can be performed in the modes of constant current or of constant height. STM spectroscopy provides relations I(V), I(Z), dI/dV, and dI/dZ. Magnetic properties For MFM measurements, the two-pass mode with tracking the sample surface topography and the mode of constant height in the scanner coordinate frame are implemented. Nanomechanics NEXT allows much room for material research by its nanosclerometry feature. Quantitative measurements of hardness and Young modulus are available with Berkovich-type probes and commercial AFM cantilevers depending on the properties of the sample.
Easy to use technology enablingmultiple AFM/STM capabilities anddelivering world class performance
Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution.
Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast one-click cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.