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Country

Company Type

Goods Manufacturer

Industries

  • Electronics ‎197
    • Sensor ‎197

Contact Info

Location

NanoWorld

  • 197Product
  • 4Types
  • 1Industry

About Company

Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in Europe. Using our knowledge as well as our high precision AFM Probes, our clients are able to get the best results they need for atomic force microscopy (AFM). Since the beginning of the 20th Century Switzerland has been a cradle of great Innovations in Precision Mechanics, and

Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in Europe. Using our knowledge as well as our high precision AFM Probes, our clients are able to get the best results they need for atomic force microscopy (AFM). Since the beginning of the 20th Century Switzerland has been a cradle of great Innovations in Precision Mechanics, and today in Micro- and Nanotechnology. Many famous Swiss clock makers started their successful work in Neuchâtel and the atomic force microscopy (AFM) was invented not far from here. In this perfect infrastructural surrounding NanoWorld AG is located next to the IMT (Institute of Microtechnology EPFL) and the CSEM (Swiss Center of Electronics and Microtechnology). With Cleanrooms and Offices close together we have the best environment to innovate and produce novel scanning probes with maximum efficiency.

Products

Tipless - Non-Contact/Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  CANTILEVER

Tipless - Non-Contact/Tapping Mode - Long Cantilever

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  CANTILEVER

Tipless - Non-Contact/Tapping Mode - Long Cantilever

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

Properties :

Inert,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging

Analytical Reports