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Product Type1428

Industries15

Nanomaterials193

Morphology26

Countries68

Properties2041

Applications2428

Manufacturers3911

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List of Products 11,172 Result

Ion Mobility Sensors (IMS)

ELECTRONICS - SENSOR   |  SENSOR

Ion Mobility Sensors (IMS)

Properties :

High sensitivity,Selectivity

Application :

Gas sensor,Chemical sensing
Sono Photonic Sensors (SPS)

ELECTRONICS - SENSOR   |  SENSOR

Sono Photonic Sensors (SPS)

Properties :

Chemical Stability,High sensitivity,Selectivity

Application :

Gas sensor
Enzyme coated Carbon Nanotube Sensor

ELECTRONICS - SENSOR   |  BIOSENSOR

CNT Enzyme coated Carbon Nanotube Sensor

Metal Nanoparticle Sensors (MNPS)

ELECTRONICS - SENSOR   |  SENSOR

Pd Metal Nanoparticle Sensors (MNPS)

Properties :

High Specific Surface Area

Application :

Hydrogen sensing
PLateau Tip - Force Modulation Mode - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

PLateau Tip - Force Modulation Mode - Reflex Coating

Properties :

High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

PLateau Tip - Force Modulation Mode

Properties :

High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Force Modulation Mode

ELECTRONICS - SENSOR   |  SENSOR

Tipless - Force Modulation Mode

Properties :

Inert,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Force Modulation Mode - Au coating

ELECTRONICS - SENSOR   |  SENSOR

Au PointProbe® Plus Force Modulation Mode - Au coating

Properties :

Versatility

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

ELECTRONICS - SENSOR   |  SENSOR

Cr PointProbe® Plus Electrostatic Force Microscopy - PtIr5 Coating

Properties :

Versatility,High sensitivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging
Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

ELECTRONICS - SENSOR   |  SENSOR

Point Probe® Plus Magnetic Force Microscopy - Low Coercivity - Reflex Coating

Properties :

Low Coercivity

Application :

Atomic force microscope (AFM) tips,AFM imaging