
ELECTRONICS - SENSOR | SENSOR
Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Properties :
Wear Resistance,High Resonance Frequency,Hardness,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Properties :
Wear Resistance,High Resonance Frequency,Hardness,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating
Properties :
Wear Resistance,High Resonance Frequency,Hardness,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Wear Resistance,High Resonance Frequency,Hardness,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Wear Resistance,High Resonance Frequency,Hardness,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | SENSOR
Al Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
Wear Resistance,High Resonance Frequency,Hardness,High sensitivity,Fast Scanning AbilityApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
Inert,High Resonance Frequency,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
Inert,High Resonance Frequency,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
Inert,High Resonance Frequency,High sensitivity,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced ResolutionApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imagingELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency
Properties :
High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency
Properties :
High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static ChargeApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled SharpnessApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled SharpnessApplication :
Atomic force microscope (AFM) tips,AFM imaging
ELECTRONICS - SENSOR | AFM TIP
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating
Properties :
High sensitivity,Dissipate Static Charge,Unrivalled SharpnessApplication :
Atomic force microscope (AFM) tips,AFM imaging